1、

silicon probe is used to work in tapping mode, and the heterodyne interferometry is applied to get the variety of amplitude. the feedback of z axis motion is the image of scratch.

为了检测纳米尺度的表面微划痕,基于原子力显微镜思想,选用硅微探针工作在轻敲模式,通过外差干涉测量振幅变化,z向反馈实现微划痕成像,构建了一套微划痕检测实验系统。

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2、

"Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array"

GB/T14141-1993硅处延层、扩散层和离子注入层薄层电阻的测定直排四探针法

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3、

Lab 1 apparatus: hot plate heater with silicon wafer ( right), connected to a temperature probe ( left).

实验一装置:加热板与矽晶圆(右)连接至感温棒(左)。

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4、

Simple probe to design of busbar for silicon metal electric furnace

工业硅电炉短网节能设计浅探

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5、

The useful conditions for exactly measuring resistivity of high purity silicon single crystal with four-point probe have been discussed.

本文讨论用四探针方法测试高纯硅单晶电阻率的测准条件。

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6、

The conditions for measuring resistivity of high purity silicon single crystal of detector grade with four-point probe

探测器级高纯硅单晶电阻率的四探针测试条件

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7、

Electron probe microanalysis ( EPMA ) shows that silicon is only substituted for phosphorus.

电子探针分析结果表明,硅只取代磷进入SAPO -5分 子筛骨架.

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8、

With the electronic probe detection, it is discovered that the mineral elements of the Buton Rock Asphalt ( BRA) contains carbon, oxygen, sulfur, silicon, magnesium, aluminium, autunite, kalium and iron.

通过电子探针检测,测得了布敦岩沥青的矿物组成元素主要为碳、氧、硫、硅、镁、铝、钙、钾及铁等;

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9、

The purpose of this thesis is based on optical scanning systems to probe the inner structures of silicon IC chips by compendious and valid methods.

本论文是以光学扫瞄系统为基础,针对矽晶片内部的结构成像设计出有效方便的架构。

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10、

Test probe for high speed functional testing of silicon IC's

硅集成电路高速功能测试探头

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11、

lab 1 apparatus: hot plate heater with silicon wafer ( right ), connected to a temperature probe ( left ).

实验一装置: 加热板与矽晶圆 ( 右 ) 连接至感温棒 ( 左 ).

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