CdS thin film, as N-type semiconductor layer and window layer in solar cell, its quality would directly affect the absorption layer which is prepared on the basis of it and is very important to the efficiency and lifetime of the batteries.

1、

Growth for Thin Film Of Organic Semiconductor Pentacene

有机半导体材料并五苯薄膜的生长

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2、

Integration of ferroelectric thin film and semiconductor creates a new generation of non volatile memories. The ferroelectric non volatile memories have some advantages over the classical semiconductor memorizers, and they are the ideal memory chip for IC card.

铁电薄膜与半导体集成产生了新一代非易失存储器，与传统的半导体非易失存储器比较具有突出的优点，是新一代IC卡的理想存储芯片。

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3、

Recent studies on ferroelectric thin film/ semiconductor heterostructure are discussed in this paper.

综述了铁电薄膜/半导体异质结构研究近年来的新进展。

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4、

Research Progress in Ferroelectric Thin Film/ Semiconductor Heterostructure

铁电薄膜/半导体异质结构的研究进展

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5、

The I-U characteristic of metal-organic thin film-semiconductor

金属-有机薄膜-半导体的伏安特性

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6、

Measurement of Refractive Index of Thin Film on Semiconductor Substrate

半导体衬底上薄膜折射率的测量

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7、

Electrochemical technique for investigating thin film rust preventive oil

研究薄层防锈油的电化学技术

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8、

We must increase the transmission of the o light and the e light at the same time when we design the AR thin film of the Wollaston prism, which is different with the normal AR thin film.

Wollaston棱镜增透膜的设计要兼顾o光e光同时增透，这是和一般基体增透膜设计的不同之处。

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9、

N this paper, a method for measuring the parameters of the absorbing thin film waveguide by prism coupling is introduced, which can determine the refractive index and thickness of waveguide by measuring the position of absorbing line of reflected light spot from prism.

介绍了一种用棱镜耦合法测量吸收性薄膜波导参数的一种方法，它是由测得棱镜底部反射光斑中模的吸收线位置来确定薄膜的折射率和厚度。

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10、

Introduction of Filter Effect of Thin Film Interference in College Physics Teaching

在大学物理教学中介绍薄膜干涉的滤波效应

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11、

Diffusion behavior of adatom and ad-dimer is one of the main researching object in the field of thin film physics.

表面吸附原子和表面二聚体的扩散是薄膜表面物理领域研究的重点课题之一。

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12、

It is simple, reliable, rapid and nondestructive and is widely used in many research fields, such as thin film physics, material science and environment science.

它广泛地应用于薄膜物理、材料科学、环境科学等各个领域。本文基于背散射分析技术，对纳米晶固氦材料和电子碰撞原子内壳层电离截面实验研究中的一些问题进行了探讨。

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13、

Ellipsometry is an important measuring method for the thin film physics and the science of the solid surface.

椭偏术是薄膜物理和表面科学的重要测量方法。

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14、

Basic properties of magneto-optical thin films are discussed. The method of thin film optics is used to study the interference enhancement of the magneto-optical effect.

讨论了磁光薄膜的基本特性，并用光学薄膜的设计技术研究了磁光效应的干涉增强。

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15、

Dielectric Thin Film in the Integrated Optics

集成光学中的介质薄膜

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16、

Diamond Thin Film for Infrared Optics

应用于红外光学中的金刚石薄膜

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17、

We choose the dye of CD-R with pilot process, and research on dye technology with Hydromechanics, Thin Film Optics, Spectral Chemistry.

运用中试过程筛选CD&R染料，并应用流体力学、薄膜光学、光谱化学对染料工艺进行分析。

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18、

The research on the phrase relationship of light on the interface is based on the theory of thin film optics-Fresnel's formula.

运用薄膜光学的理论基础&Fresnel公式，研究光在界面上的位相关系。

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19、

The paper gives the primary experimental results and the numerical simulation based on the theory of thin film optics.

本文结出的薄膜光学为基础的数字模拟和初步实验结果。

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20、

For a perpendicular anisotropic thin film, magnetic force microscopy directly gives its domain structure diagram. The component perpendicular to the film plane gives the position of the domain and the domain wall.

对于垂直各向异性的薄膜，磁力显微镜图直接给出了它的磁畴结构图，杂散场垂直于膜面的分量给出了它的磁畴和畴壁位置。

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