rutile structure

XRD patterns show that as-prepared samples are of the tetragonal rutile structure of SnO_2, and the width of the diffraction peaks of SnO_2 becomes narrower with increasing temperature.

并利用XRD、TEM等分析方法对所得的SnO2粉体进行了表征，XRD衍射峰显示为四方相金红石型SnO2，随温度升高，衍射峰宽度明显变窄，晶粒变大。

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The obtained thin film was formed by tin oxide grains with a tetragonal rutile structure, and the average particle size was 25.9 nm.

所得薄膜由平均粒径为25.9nm的具有四方相金红石结构的二氧化锡晶粒组成。

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The X-ray diffraction analysis indicate that the films are of tetragonal rutile structure without any Mn compounds, except for5% Mn doping, in which the slight orthorhombic phase appears due to the presence of defects and strain.

X射线衍射分析表明该薄膜是四方金红石结构，且未发现任何Mn的化合物。其中只有5%的Mn掺杂样品结构有微小的斜方晶相出现。

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The resulting three-component system exhibited an anatase/ rutile ( weight ratio of 73.8/ 26.2) mixed phase structure, narrower band gap ( 2.25 eV), and extremely small particle sizes ( ca. 12 nm) with metallic Ag particles well-distributed on the surface of the composite.

所得三元体系为锐钛矿与金红石混合晶相结构，锐钛矿相与金红石相质量比为73.8/26.2，带隙能窄化到2.25eV，Ag纳米粒子均匀分散在粒子尺寸约为12nm的复合物表面。

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X-ray diffraction results show that In-doped SnO 2 films are of rutile structure.

x射线衍射测试结果表明，掺In的SnO2薄膜保持SnO2的金红石结构。

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