1、

A New MOS C-V Analysis Technique is Developed in a Standard Parametric Measurement System& To Analysis Invalidation Causation of Parametric for MOST

在标准参数测试系统上开发CV分析功能&用于MOS器件参数失效分析

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3、

Traditional methods of technical efficiency measurement include parametric method and the non-parametric DEA based on radial technology distance function mainly.

传统的技术效率测算方法主要包括参数方法和基于径向技术距离函数的非参数DEA方法。

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4、

the technique of non parametric production frontiers is used to study the production efficiencies, output expansion, measurement and decomposition of output oriented production resource allocation efficiency when output disposability and economic property of production scale are taken into account.

采用非参数生产前沿面技术,从资源可处置性和生产规模经济性两方面入手,研究产出可扩张程度的生产资源配置效率&基于产出的生产资源配置效率的测度与分解问题。

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5、

Based on the theory proposed by Walls et al, an experimental scheme of quantum non demolition ( QND) measurement for intensity difference fluctuations is put forward, which is realized though a nondegenerate optical parametric amplifier.

提出了一种强度差起伏量子非破坏性(QND)测量的实验方案,该方案通过一个非简并光学参量放大腔实现。

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