1、

Measurement of target surface roughness with 4 π turning technology of AFM

用原子力显微镜4π旋转技术测量靶丸表面粗糙度

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2、

Erythrocyte Membrane Visualized by AFM under Three Conditions; The effects of bath compositions and technological parameters on the coating appearance had been studied.

AFM可视化观察三种状态下红细胞表面形貌同时考察了各种工艺条件对镀层外观形貌的影响。

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3、

The surface roughness of microlens is measured by an atomic force microscope ( AFM-ⅱ). Micro-lens forming mechanics has been analyzed by surface tension theory.

用AFMⅡ型原子力显微镜测得微透镜阵列的表面粗糙度Ra约等于0.9nm,并通过液体的表面张力理论分析了微透镜的形成机理。

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4、

The study on the crystal morphology of PCL thin films by AFM

AFM研究PCL薄膜的结晶形态

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5、

AFM revealed that, compared with the surface of PU ( U) A film, the size of hard domains became smaller.

AFM结果表明,与PU(U)A膜相比,杂化膜的硬区相畴尺寸变小。

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6、

The results of AFM and SEM showed that TiO_2 film deposited by this technique had the characteristics of uniform particle size and a tight surface structure, and the accidented surface helps the photo-catalytic reaction for the more comparative acreage.

经SEM扫描电镜与AFM原子力显微镜观测,组成薄膜的TiO2纳米颗粒粒径均匀,组织致密连续,而且薄膜表面凹凸不平,增大了有效比表面积,有利于光催化反应进行;

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7、

After a slight chemical etching, carbon cluster tracks, were observed for the first time by Atomic force microscope ( AFM) and the clear images were obtained.

然后,用其轰击固体径迹探测器CR-39,对CR-39经过腐蚀之后,用先进的原子力显微镜(AFM)对碳微团簇径迹进行了观测,得到了清晰的图像。

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8、

A time-of-flight secondary ion mass spectrometer ( TOF-SIMS), X-ray photoelectron spectroscopy ( XPS), an atomic force microscopy ( AFM), and contact angle measurements were used to characterize the monolayer.

使用时间飞行二次离子质谱仪(TOF-SIMS)、X射线光电子能谱仪(XPS)、原子力显微镜(AFM)和接触角测量仪对FTE自组装膜进行了表征。

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9、

To achieve machining characteristics of brittle materials on the nanometer scale using an AFM diamond tip as the cutting tool, scratching tests and machining tests were carried out on the surface of monocrystal silicon based on AFM.

为获得AFM金刚石微探针在纳米尺度上加工脆性材料的加工特性,在AFM系统上对单晶硅表面进行了刻划、加工实验。

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10、

Fabrication of AFM Probe Tip Based on Self-sharpening Effect

满足自锐效应的AFM探针针尖加工

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11、

The basic theories which include atomic forces between probe tip and sample surface and deformation of cantilever and so on are introduced; The design theory of AFM.

论文介绍了同AFM相关的基础理论,主要包括扫描探针与样品间原子力作用机理、微悬臂在原子力作用下的形变位移及其检测等;

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12、

When the operating force of interaction between AFM tip and the surface of liposome are beyond critical values, the liposomes rupture into bilayers.

当AFM的探针与脂质体表面相互作用力超过某临界值时,脂质体胞囊破裂,变成脂双层结构。

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13、

In the measurement process the AFM feedback controller make the scanner move the sample along z-axis and keep the vdW force between the tip and sample surface constant.

在测量过程中,AFM反馈控制器控制扫描器沿z轴移动样本,保持针尖-样本表面间的vdW力恒定。

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14、

Titration analysis, AFM and composites IFSS measurement were used to characterize the acidic functional groups contents on the fibers surface, the surface topography and its composites interfacial shear strength.

通过酸碱滴定法、原子力显微镜表征和复合材料界面剪切强度(IFSS)测试,分析纤维表面酸性官能团含量、表面形貌及其复合材料界面强度的变化规律。

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15、

Besides, this compensation method could also be used to calibrate AFM image distortion caused by thermal drift during scanning. ( 3) To further improve the efficiency.

此外,该方法还能够用于校正由热漂移引起的原子力显微镜图像失真,提高图像测量的准确性。

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16、

In-situ AFM Analysis on Thermal Stage for TATB/ AU Films

TATB/AU复合薄膜的温台原位AFM分析

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17、

Sample preparation of AFM test on ideal dispersed phase of nano powders

纳米粉体AFM分析理想分散度的制样研究

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18、

The nonlinear optical ( NLO) polymer thin films with thickness of 5 μ m on spin coating Glass/ ITO substrates were studied using AFM/ Force curve method and Tapping/ Phase.

应用AFM及力曲线的统计方法(forcecurvemethod)和Tapping/Phase功能,比较系统地研究了Glass/ITO基底上旋涂厚度为5μm的非线性光学功能高分子薄膜。

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19、

Study of Spiral Growth Structure of Nacreous Layer from Pteria Penguin and Blister Pearl by AFM

企鹅贝附壳珍珠表层螺旋生长结构的原子力显微镜研究

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20、

Observation of Human Normal Eye Corneal Epithelial Cell by AFM

正常人眼角膜上皮细胞的原子力显微镜观察

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